Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

被引：7
|
作者：
Ercius, Peter [1 ]
Muller, David [1 ]
机构：
[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609098067
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：238 / 239
页数：2
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