Self-formed InGaAs/GaAs quantum dot superlattice and direct observation on strain distribution in the capped superlattice

被引:14
|
作者
Pan, D [1 ]
Zeng, YP [1 ]
Wu, J [1 ]
Wang, HM [1 ]
Chang, CH [1 ]
Li, JM [1 ]
Kong, MY [1 ]
机构
[1] CHINESE ACAD SCI, BEIJING LAB ELECTRON MICROSCOPY, BEIJING 100080, PEOPLES R CHINA
关键词
D O I
10.1063/1.118896
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have demonstrated a 20 period dislocation-free InGaAs/GaAs quantum dot superlattice which is self-formed by the strain from the superlattice taken as a whole rather than by the strain from the strained single layer. The island formation does not take place while growing the corresponding strained single layer. From the variation of the average dot height in each layer, the strain distribution and relaxation process in the capped superlattice have been examined. It is found that the strain is not uniformly distributed and the greatest strains occur at two interfaces between the superlattice and the substrate and the cap layer in the capped superlattice. (C) 1997 American Institute of Physics.
引用
收藏
页码:2440 / 2442
页数:3
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