High throughput scanning for variations by Mismatch Repair Detection (MRD).

被引:0
|
作者
Faham, M [1 ]
Baharloo, S [1 ]
Tomitaka, S [1 ]
De Young, J [1 ]
Gajiwala, P [1 ]
Freimer, N [1 ]
机构
[1] Univ Calif San Francisco, San Francisco, CA 94143 USA
关键词
D O I
暂无
中图分类号
Q3 [遗传学];
学科分类号
071007 ; 090102 ;
摘要
517
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页码:A99 / A99
页数:1
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