Electrically pumped Er-doped light emitting slot waveguides for on-chip optical routing at 1.54 μm

被引:0
|
作者
Ramirez, J. M. [1 ]
Berencen, Y. [1 ]
Navarro-Urrios, D. [2 ]
Ferrarese Lupi, F. [3 ]
Anopchenko, A. [4 ]
Prtljaga, N. [4 ]
Rivallin, P. [5 ]
Tengattini, A. [4 ]
Colonna, J. P. [5 ]
Fedeli, J. M. [5 ]
Pavesi, L. [4 ]
Garrido, B. [1 ]
机构
[1] Univ Barcelona, Dept Elect, MIND IN2UB, Marti & Franques 1, E-08028 Barcelona, Spain
[2] Catalan Inst Nanotechnol CIN2 CSIC, Edifice CM3, E-08193 Barcelona, Spain
[3] IMM CNR, Lab MDM, I-20864 Agrate Brianza, Italy
[4] Univ Trento, Dept Phys, Nanosci Lab, I-38123 Povo, Italy
[5] CEA, Leti, Minatec campus, F-38054 Grenoble, France
关键词
Erbium; electroluminescence; silicon photonics; slot waveguide; silicon modulators; silicon nanocrystals; SILICON; AMPLIFIERS;
D O I
10.1117/12.2017250
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Optoelectronic properties of Er3+-doped slot waveguides electrically driven are presented. The active waveguides have been coupled to a Si photonic circuit for the on-chip distribution of the electroluminescence (EL) signal at 1.54 mu m. The Si photonic circuit was composed by an adiabatic taper, a bus waveguide and a grating coupler for vertical light extraction. The EL intensity at 1.54 mu m was detected and successfully guided throughout the Si photonic circuit. Different waveguide lengths were studied, finding no dependence between the waveguide length and the EL signal due to the high propagation losses measured. In addition, carrier injection losses have been observed and quantified by means of time-resolved measurements, obtaining variable optical attenuation of the probe signal as a function of the applied voltage in the waveguide electrodes. An electro-optical modulator could be envisaged if taking advantage of the carrier recombination time, as it is much faster than the Er emission lifetime.
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页数:7
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