The correction of electron lens aberrations

被引:38
|
作者
Hawkes, P. W. [1 ]
机构
[1] CNRS, CEMES, F-31055 Toulouse, France
基金
美国国家科学基金会;
关键词
Electron lens aberration correction; Quadrupoles; Sextupoles; Nion; CEOS; Transmission electron microscope (TEM); Scanning transmission electron microscope (STEM); DIFFERENTIAL PHASE-CONTRAST; HIGH-RESOLUTION TEM; SPHERICAL-ABERRATION; SINGLE ATOMS; GEOMETRICAL ABERRATIONS; SECONDARY ELECTRONS; MICROSCOPY; STEM; KV; PROSPECTS;
D O I
10.1016/j.ultramic.2015.03.007
中图分类号
TH742 [显微镜];
学科分类号
摘要
The progress of electron lens aberration correction from about 1990 onwards is chronicled. Reasonably complete lists of publications on this and related topics are appended. A present for Max Haider and Ondrej Kriyanek in the year of their 65th birthdays. By a happy coincidence, this review was completed in the year that both Max Haider and Ondrej Krivanek reached the age of 65. It is a pleasure to dedicate it to the two leading actors in the saga of aberration corrector design and construction. They would both wish to associate their colleagues with such a tribute but it is the names of Haider and Krivanek (not forgetting Joachim Zach) that will remain in the annals of electron optics, next to that of Harald Rose. I am proud to know that both regard me as a friend as well as a colleague. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:A1 / A64
页数:64
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