A method for evaluating the dielectric properties of composites using a combined embedded modulated scattering and near-field microwave nondestructive testing technique

被引：0

作者：

Hughes, D ^{[1
]}

Zoughi, R ^{[1
]}

机构：

[1] Univ Missouri, Dept Elect & Comp Engn, Rolla, MO 65401 USA

来源：

IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS | 2001年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Investigation into the derivation of the dielectric properly of a material with an embedded modulated PIN diode-loaded dipole is described, using an open-ended rectangular waveguide as the irradiating source. Previous measurements of the curing of a mortar specimen show the sensitivity of this combined technique and its potential for inspecting composite structures. Modification of previous algorithms for back calculating the dielectric properties of a material with a conductor backing is considered. The modification would involve replacing the reflection at the conductor with the reflection at a modulated dipole antenna. For this, comparisons between the reflection coefficients of dipole antenna and an infinite conducting plate are made. These results are analyzed, and the necessary considerations are discussed.

引用

页码：1882 / 1886

页数：3

共 50 条

[1] Near-field microwave and embedded modulated scattering technique for dielectric characterization of materials
Hughes, D
Zoughi, R
NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS XI, 2003, : 331 - 337
[2] Near-field microwave and embedded modulated scattering technique (MST) for dielectric characterization of materials
Hughes, D
Zoughi, R
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 22A AND 22B, 2003, 20 : 443 - 448
[3] A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part II: Dielectric property recalculation
Hughes, D
Zoughi, R
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (06) : 2398 - 2401
[4] A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part 1: Forward model
Hughes, D
Zoughi, R
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (06) : 2389 - 2397
[5] Combined bi-static near-field microwave and modulated scattering techniques for detection of embedded targets
Hughes, D
Lai, J
Behrens, C
Zoughi, R
NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS XI, 2003, : 355 - 355
[6] Quantitative microwave near-field microscopy of dielectric properties
Gao, C
Xiang, XD
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (11): : 3846 - 3851
[7] Defect imaging and characterization in composite structures using near-field microwave nondestructive testing techniques
Abu-Khousa, M
Saleh, W
Qaddoumi, N
COMPOSITE STRUCTURES, 2003, 62 (3-4) : 255 - 259
[8] FAR-FIELD ACCURACY INVESTIGATION USING MODULATED SCATTERING TECHNIQUE FOR FAST NEAR-FIELD MEASUREMENTS
MOSTAFAVI, M
BOLOMEY, JC
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1985, 33 (03) : 279 - 285
[9] A near-field monostatic microwave imaging method for dielectric cylinder
Key Laboratory of Atmospheric Sounding of China Meteorological Administration, Electronic Engineering College of Chengdu University of Information Technology, Chengdu Sichuan 610225, China
Dianbo Kexue Xuebao, 3 (562-566):
[10] Breast cancer detection using non-invasive near-field microwave nondestructive testing techniques
Saleh, W
Qaddoumi, N
ICECS 2003: PROCEEDINGS OF THE 2003 10TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3, 2003, : 1320 - 1323

← 1 2 3 4 5 →