Hard X-ray diffraction scanning tomography with sub-micrometer spatial resolution.

被引：0
|
作者：
Palancher, Herve [1 ]
Tucoulou, Remi [2 ]
Bleuet, Pierre [3 ]
Bonnin, Anne [1 ,2 ]
Cloetens, Peter [2 ]
机构：
[1] CEA, DEN, DEC, F-13108 St Paul Les Durance, France
[2] ESRF, ID22 ID22Ni, F-38043 Grenoble, France
[3] MINATEC, LETI, CEA, F-38054 Grenoble, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2010年 / 66卷
关键词：
diffraction tomography; 3D-characterization; sub-micrometer resolution;
D O I：
10.1107/S0108767310093001
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
FA5-MS40-P
引用
收藏
页码：S304 / S304
页数：1
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