Artificial intelligence in test

被引：0

|

作者：

Dean, JS ^{[1
]}

机构：

[1] LDAE,SA ALC,ADV DIAGNOST & TECHNOL INSERT CTR,KELLY AFB,TX 78241

来源：

AUTOTESTCON '96 - THE SYSTEM READINESS TECHNOLOGY CONFERENCE: TEST TECHNOLOGY AND COMMERCIALIZATION, CONFERENCE RECORD | 1996年

关键词：

D O I：

10.1109/AUTEST.1996.547718

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

引用

收藏

页码：309 / 313

页数：5

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