Probe-corrected near-field to far-field transformation using multiple spherical wave expansions

被引:1
|
作者
Rodriguez Varela, Fernando [1 ]
Galocha Iraguen, Belk [1 ]
Sierra Castaner, Manuel [1 ]
机构
[1] Univ Politecn Madrid, Av Complutense 30, Madrid, Spain
关键词
Antenna measurements; arbitrary surfaces; near-field to far-field transformation; spherical wave expansion (SWE); ANTENNA;
D O I
10.1017/S1759078720000136
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Near-field to far-field transformations constitute a powerful antenna characterization technique for near-field measurement scenarios. In this paper, a near-field to far-field transformation technique based on multiple spherical wave expansions (SWEs) is presented. Thanks to its iterative matrix inversion nature, the approach performs the transformation of fields measured on arbitrary surfaces. Also, irregular sampling schemes can be incorporated. The proposed algorithm is based on modeling the antenna fields with not one, but several SWEs distributed over its geometry. Due to the high number of SWEs, their truncation number can be arbitrarily reduced. Working with expansions of low order allows us to incorporate the probe correction in the transformation in a very simple way, accepting any type of probe and orientation. Only the probe far-field pattern is used, thus working with its full SWE is avoided. The algorithm is validated using simulated field data as well as measurements of real antennas.
引用
收藏
页码:447 / 454
页数:8
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