Formation mechanism of CuAlO2 prepared by rapid thermal annealing of Al2O3/Cu2O/Sapphire sandwich structure

被引:9
|
作者
Shih, C. H. [1 ]
Tseng, B. H. [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
关键词
oxide semiconductors; thin film reaction; rapid thermal annealing; OXIDE; FILMS; TEMPERATURE; ZNO;
D O I
10.1016/j.phpro.2012.03.574
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single-phase CuAlO2 films were successfully prepared by thin-film reaction of an Al2O3/Cu2O/sapphire sandwich structure. We found that the processing parameters, such as heating rate, holding temperature and annealing ambient, were all crucial to form CuAlO2 without second phases. Thermal annealing in pure oxygen ambient with a lower temperature ramp rate might result in the formation of CuAl2O4 in addition to CuAlO2, since part of Cu2O was oxidized to form CuO and caused the change in reaction path, i.e. CuO + Al2O3 -> CuAl2O4. Typical annealing conditions successful to prepare single-phase CuAlO2 would be to heat the sample with a temperature rampt rate higher than 7.3 degrees C/sec and hold the temperature at 1100 degrees C in air ambient. The formation mechanism of CuAlO2 has also been studied by interrupting the reaction after a short period of annealing. TEM observations showed that the top Al2O3 layer with amorphous structure reacted immediately with Cu2O to form CuAlO2 in the early stage and then the remaining Cu2O reacted with the sapphire substrate. (C) 2012 Published by Elsevier B.V. Selection and/or peer review under responsibility of Chinese Vacuum Society (CVS).
引用
收藏
页码:395 / 400
页数:6
相关论文
共 50 条
  • [1] Characterization of CuAlO2 thin film prepared by rapid thermal annealing of an Al2O3/Cu2O/sapphire structure
    Shy, JH
    Tseng, BH
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2005, 66 (11) : 2123 - 2126
  • [2] Rapid formation of transparent CuAlO2 thin film by thermal annealing of Cu on Al2O3
    Lockman, Zainovia
    Lin, Loh Poh
    Yew, Cheong Kuan
    Hutagalung, Sabar Derita
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2009, 93 (08) : 1383 - 1387
  • [3] Formation of CuAlO2 at the Cu/Al2O3 Interface and its Influence on Interface Strength and Thermal Conductivity
    Lee, Shao-Kuan
    Tuan, Wei-Hsing
    INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, 2013, 10 (05) : 780 - 789
  • [4] Influence of Cu2O and CuAlO2 interphases on crack propagation at Cu/alpha-Al2O3 interfaces
    Reimanis, IE
    Trumble, KP
    Rogers, KA
    Dalgleish, BJ
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1997, 80 (02) : 424 - 432
  • [5] The influence of CuAlO2 on the strength of eutectically bonded Cu/Al2O3 interfaces
    Seager, CW
    Kokini, K
    Trumble, K
    Krane, MJM
    SCRIPTA MATERIALIA, 2002, 46 (05) : 395 - 400
  • [6] Novel interpenetrating Cu–Al2O3 structures by controlled reduction of bulk CuAlO2
    M. Kracum
    A. Kundu
    M. P. Harmer
    H. M. Chan
    Journal of Materials Science, 2015, 50 : 1818 - 1824
  • [7] Defects in CU2O, CuAlO2 and SrCU2O2 transparent conducting oxides
    Nolan, Michael
    THIN SOLID FILMS, 2008, 516 (22) : 8130 - 8135
  • [8] Absence of coupled thermal interfaces in Al2O3/Ni/Al2O3 sandwich structure
    Li, Xiangyu
    Park, Wonjun
    Chen, Yong P.
    Ruan, Xiulin
    APPLIED PHYSICS LETTERS, 2017, 111 (14)
  • [9] Adsorption of water on Cu2O and Al2O3 thin
    Deng, Xingyi
    Herranz, Tirma
    Weis, Christoph
    Bluhm, Hendrik
    Salmeron, Miquel
    JOURNAL OF PHYSICAL CHEMISTRY C, 2008, 112 (26): : 9668 - 9672
  • [10] THERMODYNAMICS OF CuAlO2 AND CuAl2O4 AND PHASE EQUILIBRIA IN THE SYSTEM Cu2O-CuO-Al2O3.
    Jacob, K.T.
    Alcock, C.B.
    1600, (58): : 5 - 6