Comparison of Characterization Methods for Statistical Analysis of SoC Designs

被引:0
|
作者
Kim, Wook [1 ]
Hyun, Dai Joon [1 ]
Kim, Young Hwan [1 ]
Do, Kyung Tae [2 ]
机构
[1] Pohang Univ Sci & Technol, Div Elect & Comp Engn, Pohang, South Korea
[2] CAE, Samsung Elect, Yongin, South Korea
关键词
D O I
10.1109/ECTICON.2008.4600549
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper compares characteristics and performances of characterization methods for statistical timing analysis and statistical leakage estimation. Two popular characterization methods. regular grid sampling and distribution based sampling are selected and their features, advantages and disadvantages are discussed. The experimental results performed with ISCAS benchmark circuits showed the accuracy of using two methods in statistical analysis. In statistical timing analysis, distribution based sampling, which is good approach when the variation is not large, shows good performance in terms of accuracy. However, in statistical leakage estimation, regular grid sampling, which is superior when the variation is very large, shows good performance.
引用
收藏
页码:789 / +
页数:2
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