PLASMONIC WAVEGUIDES FEATURES CORRELATED WITH SURFACE PLASMON RESONANCE PERFORMED WITH A LOW REFRACTIVE INDEX PRISM

被引:0
|
作者
Vasile, Georgiana C. [1 ]
Popescu, Aurelian A. [2 ]
Stafe, Mihai [1 ]
Koziukhin, S. A. [3 ]
Savastru, Dan [2 ]
Dontu, Simona [2 ]
Baschir, L. [2 ]
Sava, V. [4 ]
Chiricuta, B. [4 ]
Mihailescu, Mona [1 ]
Negutu, Constantin [1 ]
Puscas, Niculae N. [1 ]
机构
[1] Univ Politehn Bucuresti, Dept Phys, Bucharest 060042, Romania
[2] Natl Inst R&D Optoelect, Magurele 77125, Ilfov, Romania
[3] Kurnakov Inst Gen & Inorgan Chem RAS Russia, Moscow 119991, Russia
[4] SC Apel Laser SRL, Bucharest, Romania
关键词
plasmonics; photonics; chalcogenide amorphous materials; GaLaS; SPECTROSCOPY;
D O I
暂无
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
The surface plasmon resonance calculations were performed for Kretschmann configuration. Two of the layers, gold and chalcogenide films (GaLaS), have finite thickness. The refractive index of coupling prism material is supposed to be lower than the refractive index of amorphous film which composes a plasmonic waveguide. The amorphous film thickness for which plasmonic resonances occur was established. The calculations were performed for TE- and TM- modes (both for visible and IR domain) concerning the propagation constants, the attenuation coefficient and the electromagnetic field distribution. The results provide the conditions for design an optical memory device based on light-light interaction in plasmonic configuration.
引用
收藏
页码:311 / 325
页数:15
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