Optical methods in characterization of HTSC thin film substrates

被引：0
|
作者：
RybaRomanowski, W
机构：
[1] Inst. of Low Temp. and Struct. Res., Polish Academy of Sciences, 50-950 Wroclaw
来源：
ACTA PHYSICA POLONICA A | 1997年 / 92卷 / 01期
关键词：
D O I：
10.12693/APhysPolA.92.135
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Short overview of optical methods which proved to be useful in the characterization of HTSC thin film substrates is presented. Preliminary tests in polariscopic arrangements, interferometric measurements, optical absorption and emission spectroscopy reveal macroscopic deficiencies of the crystal. Intentionally introduced impurity ions serve as probes of a local strength and symmetry of the crystal field. Results of optical study of SrLaGaO4 and SrLaAlO4 crystals are presented and discussed.
引用
收藏
页码：135 / 138
页数：4
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