Wavelet-based time-domain solution of multiconductor transmission lines with skin and proximity effect

被引：15

作者：

Barmada, S ^{[1
]}

Musolino, A ^{[1
]}

Raugi, M ^{[1
]}

机构：

[1] Univ Pisa, Dipartimento Sistemi Elettr & Automaz, I-56126 Pisa, Italy

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2005年 / 47卷 / 04期

关键词：

interconnects; proximity effect; skin effect; wavelet expansion;

D O I：

10.1109/TEMC.2005.857868

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A time-domain wavelet-based method for the analysis of transmission lines (TLs) characterized by the presence of skin and proximity effects is presented. The method is based on the time domain TL equations, expressed in terms of transient resistance and convolution operator. A formulation of the convolution in the wavelet domain is presented here, and is used to expand the TL equations in the wavelet domain. In this way, the TL equations, properly discretized in the space variable, are reduced to an algebraic system characterized by a sparse block matrix whose blocks are easily calculated. The solution of the system is conveniently performed using standard techniques, avoiding step by step procedures. The method can be applied to linear and nonlinear problems, characterized by conductors of different shapes. The results obtained are compared with standard techniques, showing both accuracy and CPU time reduction.

引用

页码：774 / 780

页数：7

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