Reduction of contact resistance by selective contact doping in fullerene n-channel organic field-effect transistors

被引:49
|
作者
Singh, Sanjeev [1 ,2 ]
Mohapatra, Swagat K. [1 ,3 ]
Sharma, Asha [1 ,2 ]
Fuentes-Hernandez, Canek [1 ,2 ]
Barlow, Stephen [1 ,3 ]
Marder, Seth R. [1 ,3 ]
Kippelen, Bernard [1 ,2 ]
机构
[1] Georgia Inst Technol, Ctr Organ Photon & Elect, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[3] Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
THIN-FILM TRANSISTORS; AIR-STABLE ORGANOMETALLICS;
D O I
10.1063/1.4802237
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the contact-doping effect on high performance n-channel C-60 organic field-effect transistors (OFETs) using the air-stable rhodocene dimer as an n-type dopant. The average charge mobility improved from a value of 0.48 cm(2)/(Vs) in a reference device to 1.65 cm(2)/(Vs) for contact-doped devices with a channel length of 25 mu m. The operational stability of contact-doped OFETs under continuous stress bias was found similar to the reference devices. (C) 2013 AIP Publishing LLC [http://dx.doi.org/10.1063/1.4802237]
引用
收藏
页数:4
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