A Shannon sampling approach to form error estimation

被引:3
|
作者
Yang, TH [1 ]
Jackman, J [1 ]
机构
[1] Iowa State Univ, Coll Engn, Dept Ind & Mfg Syst Engn, Ames, IA 50011 USA
关键词
Shannon sampling; form error estimation; design specifications;
D O I
10.1243/0954405021519870
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Form error estimation is a critical step in verifying that a product satisfies design specifications. It is demonstrated how Shannon sampling can be used to reconstruct surface profiles if they are treated as band-limited signals. To demonstrate its use in form estimation, a Shannon sampling series is applied to flatness error estimation for uniform sample points measured from five common machined surfaces. The results indicate that Shannon sampling provides superior performance over using points directly for estimation.
引用
收藏
页码:225 / 233
页数:9
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