Near-field imaging of perfectly conducting grating surfaces

被引:21
|
作者
Cheng, Ting [1 ]
Li, Peijun [2 ]
Wang, Yuliang [2 ]
机构
[1] Cent China Normal Univ, Sch Math & Stat, Wuhan 430079, Hubei, Peoples R China
[2] Purdue Univ, Dept Math, W Lafayette, IN 47907 USA
基金
美国国家科学基金会;
关键词
INVERSE SCATTERING-THEORY; DOUBLY PERIODIC STRUCTURE; FINITE-ELEMENT-METHOD; NUMERICAL-SOLUTION; ROUGH-SURFACE; PROFILE RECONSTRUCTION; DIFFRACTION GRATINGS; UNIQUENESS THEOREMS; SHAPE DEFORMATIONS; BINARY GRATINGS;
D O I
10.1364/JOSAA.30.002473
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A novel approach is presented to solving the inverse diffractive grating problem in near-field optical imaging, which is to reconstruct perfectly conducting grating surfaces with resolution beyond the diffraction limit. The grating surface is assumed to be a small and smooth deformation of a plane surface. An analytical solution of the direct grating problems is derived by using the method of transformed field expansion. Based on the analytic solution, an explicit reconstruction formula is deduced for the inverse grating problem. The method requires only a single incident field and is realized efficiently by using the fast Fourier transform. Numerical results show that the method is simple, stable, and effective in reconstructing grating surfaces with super-resolved resolution. (C) 2013 Optical Society of America
引用
收藏
页码:2473 / 2481
页数:9
相关论文
共 50 条
  • [1] MICROWAVE DIVERSITY IMAGING OF PERFECTLY CONDUCTING OBJECTS IN THE NEAR-FIELD REGION
    CHU, TH
    LIN, DB
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (03) : 480 - 487
  • [2] NEAR-FIELD IMAGING FOR CONDUCTING OBJECTS
    LI, HJ
    LIN, FL
    IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1991, 39 (05) : 600 - 605
  • [3] Near-field thermal imaging of nanostructured surfaces
    Kittel, A.
    Wischnath, U. F.
    Welker, J.
    Huth, O.
    Rueting, F.
    Biehs, S. -A.
    APPLIED PHYSICS LETTERS, 2008, 93 (19)
  • [4] Imaging of reflective surfaces by near-field optics
    Bao, Gang
    Lin, Junshan
    OPTICS LETTERS, 2012, 37 (24) : 5027 - 5029
  • [5] Imaging of Rough Surfaces by Near-field Measurement
    Chien, Wei
    Chiu, Chien-Ching
    Chen, Po-Hsiang
    Jiang, Hao
    Chan, Shun-Jie
    SENSORS AND MATERIALS, 2021, 33 (07) : 2333 - 2344
  • [6] NEAR-FIELD IMAGING OF INFINITE ROUGH SURFACES
    Bao, Gang
    Li, Peijun
    SIAM JOURNAL ON APPLIED MATHEMATICS, 2013, 73 (06) : 2162 - 2187
  • [7] Near-field imaging of dipole emission modulated by an optical grating
    Ko, Dong Hyuk
    Brown, Graham G.
    Zhang, Chunmei
    Corkum, P. B.
    OPTICA, 2021, 8 (12): : 1632 - 1637
  • [8] Topography characterization of a deep grating using near-field imaging
    Gregersen, N
    Tromborg, B
    Volkov, VS
    Bozhevolnyi, SI
    Holm, J
    APPLIED OPTICS, 2006, 45 (01) : 117 - 121
  • [9] Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy
    Cory, H
    Boccara, AC
    Rivoal, JC
    Lahrech, A
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 1998, 18 (02) : 120 - 124
  • [10] Near-field imaging of surfaces with Gaussian distribution of carriers
    Lozovski, V.
    Vasilenko, V.
    Tarasov, G.
    Mazur, Yu.
    Salamo, G.
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2007, 24 (07) : 1542 - 1548