X-ray studies on optical and structural properties of ZnO nanostructured thin films

被引：38

作者：

Larcheri, S

Armellini, C

Rocca, F ^{[1
]}

Kuzmin, A

Kalendarev, R

Dalba, G

Graziola, R

Purans, J

Pailharey, D

Jandard, F

机构：

[1] ITC CeFSA Trento, IFN CNR Sect, I-38050 Trento, Italy

[2] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia

[3] INFM, I-38050 Trento, Italy

[4] Dept Phys, I-38050 Trento, Italy

[5] Univ Aix Marseille 2, CNRS, UPR 7251, CRMCN, F-13009 Marseille, France

来源：

SUPERLATTICES AND MICROSTRUCTURES | 2006年 / 39卷 / 1-4期

关键词：

D O I：

10.1016/j.spmi.2005.08.048

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

X-ray absorption near-edge fine Structure (XANES) studies have been carried out oil nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 mu m) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the Structural and optical properties of ZnO nanostructured samples. (C) 2005 Elsevier Ltd. All rights reserved.

引用

页码：267 / 274

页数：8

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