Effect of surface polishing and oxidization induced strain on electronic order at the Verwey transition in Fe3O4

被引:13
|
作者
Tabis, W. [1 ,2 ]
Lorenzo, J. E. [3 ]
Kozlowski, A. [1 ]
Kolodziej, T. [1 ]
Tarnawski, Z. [1 ]
Kakol, Z. [1 ]
Mazzoli, C. [4 ]
Walker, H. C. [4 ]
Jaouen, N. [5 ]
Mannix, D. [3 ]
Marin, C. [6 ]
Honig, J. M. [7 ]
机构
[1] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland
[2] Univ Minnesota, Sch Phys & Astron, Minneapolis, MN 55455 USA
[3] Inst Neel CNRS UJF, F-38042 Grenoble 9, France
[4] European Synchrotron Radiat Facil, F-38054 Grenoble 9, France
[5] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France
[6] CEA INAC UJF Grenoble 1, SPSMS, UMR E 9001, IMAPEC, F-38054 Grenoble 9, France
[7] Purdue Univ, Dept Chem, W Lafayette, IN 47907 USA
关键词
X-RAY-SCATTERING; LOW-TEMPERATURE OXIDATION; 2ND LENGTH SCALE; CRITICAL FLUCTUATIONS; MAGNETITE; ORIGIN; POINT;
D O I
10.1088/0953-8984/25/5/055603
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Following the controversy between two previous publications (Lorenzo et al 2008 Phys. Rev. Lett. 101 226401 and Garcia et al 2009 Phys. Rev. Lett. 102 176405), we report on the influence of mechanical polishing, and subsequent sample storage, on the electronic order at the Verwey transition of highly pure magnetite, Fe3O4, by resonant x-ray scattering. Contrary to expectations, mechanically polishing the surface induces an inhomogeneous micron deep dead layer, probably of powdered Fe3O4. In addition, we have found that polishing the sample immediately before the experiment influences and favors the appearance of long range order electronic correlations, whereas samples polished well in advance have their electronic order quenched. Conversely, lattice distortions associated with the Verwey transition appear less affected by the surface state. We conclude that mechanical polishing induces stresses at the surface that may propagate into the core of the single crystal sample. These strains relax with time, which affects the different order parameters, as measured by x-ray resonant diffraction.
引用
收藏
页数:7
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