共 3 条
- [1] Optical metrology aimed for process quality-control-loops (QCL) in production-modules for micro-technology 2004 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN & CYBERNETICS, VOLS 1-7, 2004, : 5417 - 5422
- [3] Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production Machine Vision and Applications, 2014, 25 : 1411 - 1422