Fourier transform infrared spectroscopy of CF4 plasmas in the GEC reference cell

被引:15
|
作者
Cruden, BA [1 ]
Rao, MVVS [1 ]
Sharma, SP [1 ]
Meyyappan, M [1 ]
机构
[1] NASA, Ames Res Ctr, Plasma Res Lab, ELORET Corp, Moffett Field, CA 94035 USA
来源
PLASMA SOURCES SCIENCE & TECHNOLOGY | 2002年 / 11卷 / 01期
关键词
D O I
10.1088/0963-0252/11/1/310
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Fourier transform infrared spectroscopy (FTIR) has been used to characterize inductively coupled CF4 plasmas in a GEC reference cell in situ. In examining these FTIR spectra., several assumptions and approximations of FTIR analysis are addressed. This includes the density dependence of cross-sections, non-linear effects in the addition of overlapping bands and the effect of spatial variations in density and temperature. This analysis demonstrates that temperatures extracted from FTIR spectra may provide a poor estimate of the true neutral plasma temperature. The FTIR spectra are dominated by unreacted CF4. accounting for 40-60% of the gas products. The amount of CF4 consumption is found to have a marked dependence on power. and is nearly independent of pressure in the range of 10-50 mTorr. Small amounts of C2F6 are observed at low power. Also observed are etching products from the quartz window-SiF4, COF2 and CO-which occur in approximately equal ratios and together account for 17-19% of the cas at 300 W and 6-9% of the gas at 100 W. The concentrations of these species are nearly independent of pressure. CFx radicals are below the detection limit of this apparatus (similar to10(13) cm(-3)).
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页码:77 / 90
页数:14
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