Wobble-based on-chip calibration circuit for temperature independent oscillators

被引：0

作者：

De Smedt, V. ^{[1
]}

Steyaert, W. ^{[1
]}

Dehaene, W. ^{[1
]}

Gielen, G. ^{[1
]}

机构：

[1] Katholieke Univ Leuven, ESAT MICAS, B-3001 Heverlee, Belgium

来源：

ELECTRONICS LETTERS | 2012年 / 48卷 / 16期

关键词：

D O I：

10.1049/el.2012.1886

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An automatic calibration circuit for temperature- and process-independent oscillators and timing circuits is presented. The circuit monitors the dynamic gate-source voltage of a MOS transistor of which the temperature is changing. By adapting the bias current through this transistor towards the zero-temperature-coefficient point of the V-GS, the gate-source voltage can be used in temperature- independent timing circuits. Because of the dynamic nature of this regulation circuit, the technique is insensitive to mismatch and process variations. The presented technique is applied to a low-noise oscillator to make it less temperature sensitive with a factor of 8.

引用

页码：1000 / 1001

页数：2

共 50 条

[1] Temperature Calibration Technique Based on On-Chip Resistor
Narczyk, Pawel
Siwiec, Krzysztof
Pleskacz, Witold A.
PROCEEDINGS OF THE 24TH INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS - MIXDES 2017, 2017, : 328 - 332
[2] Calibration of Interconnect Corners Using On-Chip Ring Oscillators
Hyun, Daijoon
Shin, Youngsoo
2015 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC), 2015, : 141 - 142
[3] An on-chip measurement circuit for calibration by combination selection
Maunu, Janne
Marku, Joona
Laiho, Mika
Paasio, Ari
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2006, : 63 - +
[4] Temperature Calibration of an On-Chip Relaxation Oscillator
Mikulic, J.
Brezovec, I.
Magerl, M.
Schatzberger, G.
Baric, A.
2017 40TH INTERNATIONAL CONVENTION ON INFORMATION AND COMMUNICATION TECHNOLOGY, ELECTRONICS AND MICROELECTRONICS (MIPRO), 2017, : 93 - 97
[5] An on-chip high speed serial communication method based on independent ring oscillators
Kimura, S
Hayakawa, T
Horiyama, T
Nakanishi, M
Watanabe, K
2003 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE: DIGEST OF TECHNICAL PAPERS, 2003, 46 : 390 - 391
[6] An on-chip calibration technique for reducing supply voltage sensitivity in ring oscillators
Wu, Ting
Mayaram, Kartikeya
Moon, Un-Ku
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2007, 42 (04) : 775 - 783
[7] On-chip RC measurement and calibration circuit using Wheatstone bridge
Putter, B. M.
PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10, 2008, : 1496 - 1499
[8] Temperature and On-chip Crosstalk Measurement using Ring Oscillators in FPGA
Gag, Martin
Wegner, Tim
Waschki, Ansgar
Timmermann, Dirk
2012 IEEE 15TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), 2012, : 201 - 204
[9] A Dynamic Calibration Scheme for On-Chip Process and Temperature Variations
Raymond, Mina
Ghoneima, Maged
Ismail, Yehea
2011 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2011, : 2047 - 2050
[10] On-chip temperature control circuit using common devices
Braun, FD
Parent, DW
Papalias, TA
CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2005, : 215 - 218

← 1 2 3 4 5 →