Brightness temperature simulation of snow cover based on snow grain size evolution using in situ data

被引:3
|
作者
Wu, Lili [1 ,2 ]
Li, Xiaofeng [1 ,3 ]
Zhao, Kai [1 ,3 ]
Zheng, Xingming [1 ,3 ]
Jiang, Tao [1 ,3 ]
机构
[1] Chinese Acad Sci, Northeast Inst Geog & Agroecol, 4888 Shengbei St, Changchun 130102, Peoples R China
[2] Univ Chinese Acad Sci, 19 A Yuquan Rd, Beijing 100049, Peoples R China
[3] Chinese Acad Sci, Changchun Jingyuetan Remote Sensing Test Site, 4888 Shengbei St, Changchun 130102, Peoples R China
基金
中国国家自然科学基金;
关键词
brightness temperature simulation; snow grain size evolution; passive microwave pixel; microwave radiation imager (MWRI); snow cover; MICROWAVE EMISSION MODEL; REMOTE-SENSING DATA; PASSIVE-MICROWAVE; WATER EQUIVALENT; RADIATIVE-TRANSFER; AMSR-E; DEPTH; ASSIMILATION;
D O I
10.1117/1.JRS.10.036016
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Snow depth parameter inversion from passive microwave remote sensing is of great significance to hydrological process and climate systems. The Helsinki University of Technology (HUT) model is a commonly used snow emission model. Snow grain size (SGS) is one of the important input parameters, but SGS is difficult to obtain in broad areas. The time series of SGS are first evolved by an SGS evolution model (Jordan 91) using in situ data. A good linear relationship between the effective SGS in HUT and the evolution SGS was found. Then brightness temperature simulations are performed based on the effective SGS and evolution SGS. The results showed that the biases of the simulated brightness temperatures based on the effective SGS and evolution SGS were -6.5 and -3.6 K, respectively, for 18.7 GHz and -4.2 and -4.0 K for 36.5 GHz. Furthermore, the model is performed in six pixels with different land use/cover type in other areas. The results showed that the simulated brightness temperatures based on the evolution SGS were consistent with those from the satellite. Consequently, evolution SGS appears to be a simple method to obtain an appropriate SGS for the HUT model. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:17
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