Diffraction property of multi-layer dielectric gratings studied by rigorous coupled-wave analysis

被引:9
|
作者
Kong Wei-Jin [1 ]
Yun Mao-Jin [1 ]
Sun Xin [1 ]
Liu Jun-Hai [1 ]
Fan Zheng-Xiu [2 ]
Shao Jian-Da [2 ]
机构
[1] Qingdao Univ, Coll Phys Sci, Qingdao 266071, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
基金
中国国家自然科学基金;
关键词
diffraction efficiency; multi-layer dielectric grating; rigorous coupled-wave analysis;
D O I
10.7498/aps.57.4904
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
dThe rigorous coupled-wave analysis technique for describing the diffraction of multi-layer diffraction grating ( MDG) is put forward. Formulations for a stable and efficient numerical implementation of diffraction efficiency are presented for MIX, for TE polarization and Littrow angle. With the merit function of the - I order diffraction efficiency higher than 96%, the parameters of MDG are optimized for HfO2 and SiO2 top layers, respectively. Numerical calculation indicates that a larger grating parameter range can be obtained with HfO2 rather than the SiO2 on the top. The manufacture tolerance and the effective incident angle for the optimized structure of MDG are discussed in the end.
引用
收藏
页码:4904 / 4910
页数:7
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