On the road to high-resolution 3D molecular imaging

被引:14
|
作者
Delcorte, Arnaud [1 ]
机构
[1] Catholic Univ Louvain, PCPM Lab, Louvain, Belgium
关键词
ToF-SIMS; SIMS imaging; Depth-profiling; Molecular ion; Chemical analysis; Surface characterization; Nanotechnology; Cell; Organics; Polymers;
D O I
10.1016/j.apsusc.2008.05.111
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This contribution reviews the state-of-the-art in the domains of molecular imaging and depth profiling, the two methodological platforms required for 3D molecular imaging by secondary ion mass spectrometric (SIMS). Using molecular dynamics calculations, it also describes some of the mechanisms that make cluster projectiles such as C-60 so different for organic sample analysis. The discussion addresses issues that deserve proper attention on the way to 3D molecular imaging in SIMS, such as ultimate lateral resolution, limited molecular yields, chemical effects and damage, and highlights solutions currently in embryo in the many research teams concerned by 3D molecular imaging. (C) 2008 Elsevier B. V. All rights reserved.
引用
收藏
页码:954 / 958
页数:5
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