Vertical Dependence of Refractive Index Structure Constant in Lowest Troposphere

被引：9
|
作者：
Grabner, Martin [1 ]
Kvicera, Vaclav [1 ]
Pechac, Pavel [2 ]
Jicha, Otakar [2 ]
机构：
[1] Czech Metrol Inst, Frequency Engn Dept, Prague 14801 4, Czech Republic
[2] Czech Tech Univ, Dept Electromagnet Field, Prague 16627 6, Czech Republic
来源：
IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS | 2011年 / 10卷
关键词：
Atmospheric refractivity; microwave propagation; scintillation; structure constant; LINKS; SCINTILLATION;
D O I：
10.1109/LAWP.2011.2178809
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Vertical profiles of atmospheric refractivity are indirectly measured at heights of up to 150 m above the ground using meteorological sensors located at 19 heights. The structure constant of the refractive index is calculated from data measured over a one-year period using its definition relation. Linear regression in heights is applied to a structure constant vertical dependence to obtain single and joint annual statistics of the near ground value of and of its vertical gradient in the lowest troposphere. Approximate probability models are given with being log-normal and the vertical gradient normally distributed.
引用
收藏
页码：1473 / 1475
页数：3
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