Grain boundary modeling and characterization of thin-film silicon solar cells

被引：0
|
作者：
Sproul, AB [1 ]
Edmiston, SA [1 ]
Puzzer, T [1 ]
Heiser, G [1 ]
Wenham, SR [1 ]
Green, MA [1 ]
Young, TL [1 ]
机构：
[1] UNIV NEW S WALES,CTR PHOTOVOLTA DEVICES & SYST,SYDNEY,NSW 2052,AUSTRALIA
来源：
CONFERENCE RECORD OF THE TWENTY FIFTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1996 | 1996年
关键词：
D O I：
10.1109/PVSC.1996.564065
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：549 / 552
页数：4
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