FTIR and Dielectric Studies of Se90Cd10-xInx Glassy Alloys

被引：5

作者：

Dwivedi, D. K. ^{[1
]}

Shukla, Nitesh ^{[1
]}

Pathak, H. P. ^{[1
]}

机构：

[1] MMM Univ Technol, Amorphous Semicond Res Lab, Dept Phys, Gorakhpur 273010, Uttar Pradesh, India

来源：

MATERIALS TODAY-PROCEEDINGS | 2015年 / 2卷 / 4-5期

关键词：

Chalcogenide glass; melt quench technique; dielectric properties; impedance spectroscopic technique; CHALCOGENIDE GLASSES; RELAXATION; SYSTEM; TRANSPORT; BEHAVIOR; FILMS; AG;

D O I：

10.1016/j.matpr.2015.07.302

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Chalcogenide glassy alloys of Se90Cd10-xInx (x=2,4,6,8) are synthesized by melt quench technique. The FTIR transmission spectroscopy studies has been carried out in the range 400-4000 cm(-1). In the transmittance curve various absorption bands are seen. Dielectric properties of Se90Cd10-xInx (x=2,4,6,8) chalcogenide glassy system have been studied using impedance spectroscopic technique in the frequency range 42Hz-5MHz at room temperature. It is found that the dielectric constants.' and dielectric loss factor epsilon '' both depends on frequency. Both epsilon' and epsilon '' are found to be decreasing with the In content in Se90Cd10-xInx (x=2,4,6,8) glassy alloys. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：2862 / 2867

页数：6

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