Defect Detection in Double-Sided Cooled Power Modules by Structure Functions

被引:0
|
作者
Scognamillo, Ciro [1 ]
Catalano, Antonio Pio [1 ]
D'Alessandro, Vincenzo [1 ]
Codecasa, Lorenzo [2 ]
Castellazzi, Alberto [3 ]
机构
[1] Univ Federico II, Dept Elect Engn & Informat Technol, Naples, Italy
[2] Politecn Milan, Dept Elect Informat & Bioengn, Milan, Italy
[3] Kyoto Univ Adv Sci, Solid State Power Proc Lab, Kyoto, Japan
关键词
Defect detection; double-sided cooled; power modules; silicon carbide VDMOS; structure functions;
D O I
10.1109/PRIME55000.2022.9816814
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an approach based on structure functions aimed to the defect detection in state-of-the-art double-sided cooled power modules. The investigation is conducted by means of highly detailed 3-D finite-element method thermal simulations on the exact replica of a power module. Typical defects are emulated ad-hoc in the numerical environment: solder delamination, detached interconnections, and voids/bubbles in the thermal interface material. It is demonstrated that assigned defects give specific shapes to the structure functions; once these shapes are classified, the nature of the defects can be easily unraveled from experimental data.
引用
收藏
页码:81 / 84
页数:4
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