Enhanced emission of Ge2+ secondary ions under N-2(+) bombardment

被引：0
|
作者：
Ray, N
Rajasekar, P
Dey, SD
机构：
[1] Saha Institute of Nuclear Physics, Calcutta 700 064, 1/AF, Bidhannagar
来源：
VACUUM | 1996年 / 47卷 / 03期
关键词：
D O I：
10.1016/0042-207X(95)00206-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A comparative study of the secondary ion signals (I-n+, n = 1,2) for the N-2(+) - Ge and N-2(+) - Si ion-target combinations under varying bombardment conditions has been undertaken. Only the former reveals anomalous Ge2+ emission I2+/I+(Ge) > 1) over a wide range of primary energy (E) and target current densities (J(p)). A possible explanation has been sought. This work is actually a follow-up of our previous works carried out in search of anomalous emission of multicharged ions for various ion-target combinations.
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页码：287 / 290
页数：4
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