Using reflectance anisotropy spectroscopy to characterize capped silver nanostructures grown on silicon

Using the single domain Si(111)-3x1-Ag surface as a template, room temperature deposition of two or more monolayers of Ag leads to the formation of metallic nanostructures. Reflectance anisotropy spectroscopy (RAS) in the infrared (IR) spectral region is used to analyse the anisotropic conductivity of the structures. The anisotropy is found to be influenced by the offcut angle of the substrate, and hence the terrace width. The Ag nanostructures were capped with Si to form a near-IR transparent protecting layer. The samples are stable to exposure to ambient conditions for significant periods. The RAS spectra are compared to model calculations, which support the conclusion that the buried metallic Ag nanostructures survive the capping process. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.