Penetration depth of MgB2 measured using Josephson junctions and SQUIDs

被引:18
|
作者
Cunnane, Daniel [1 ]
Zhuang, Chenggang [1 ]
Chen, Ke [1 ]
Xi, X. X. [1 ]
Yong, Jie [2 ]
Lemberger, T. R. [2 ]
机构
[1] Temple Univ, Dept Phys, Philadelphia, PA 19122 USA
[2] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
关键词
THIN-FILMS; SUPERCONDUCTORS;
D O I
10.1063/1.4793194
中图分类号
O59 [应用物理学];
学科分类号
摘要
The penetration depth of MgB2 was measured using two methods of different mechanisms. The first method used MgB2 Josephson junctions and the magnetic field dependence of the junction critical current. The second method deduced the penetration depth from the inductance of a MgB2 microstrip used to modulate the voltage of a MgB2 DC SQUID. The two methods showed a consistent value of the low-temperature penetration depth for MgB2 to be about 40 nm. Both the small penetration depth value and its temperature dependence are in agreement with a microscopic theory for MgB2 in the clean limit. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793194]
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页数:4
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