We have studied the geometries, formation energies, migration barriers and diffusion of a copper interstitial with different charge states with and without an external electric field in the alpha-cristobalite crystalline form of SiO2 using ab initio computer simulation. The most stable state almost throughout the band gap is charge q = +1. The height of the migration barrier depends slightly on the charge state and varies between 0.11 and 0.18 eV. However, the charge has a strong influence on the shape of the barrier, as metastable states exist in the middle of the diffusion path for Cu with q = + 1. The heights and shapes of barriers also depend on the density of SiO2, because volume expansion has a similar effect to increase the positive charge on Cu. Furthermore, diffusion coefficients have been deduced from our calculations according to transition-state theory and these calculations confirm the experimental result that oxidation of Cu is a necessary condition for diffusion. Our molecular dynamics simulations show a similar ion diffusion, and dependence on charge state. These simulations also confirm the fact that diffusion of ions can be directly simulated using ab initio molecular dynamics.
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London Ctr Nanotechnol, London WC1H 0AH, England
UCL, Thomas Young Ctr, London WC1E 6BT, EnglandLondon Ctr Nanotechnol, London WC1H 0AH, England
Rodriguez-Prieto, A.
Bowler, D. R.
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London Ctr Nanotechnol, London WC1H 0AH, England
UCL, Thomas Young Ctr, London WC1E 6BT, England
UCL, Dept Phys & Astron, London WC1E 6BT, EnglandLondon Ctr Nanotechnol, London WC1H 0AH, England
机构:
Inst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Sorbonne Univ, Inst Nanosci Paris, UMR 7588, F-75005 Paris, France
ArcelorMittal Maizieres Res, F-57280 Voie Romaine, Maizieres Les M, FranceInst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Le, Ha-Linh Thi
Goniakowski, Jacek
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Inst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Sorbonne Univ, Inst Nanosci Paris, UMR 7588, F-75005 Paris, FranceInst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Goniakowski, Jacek
Noguera, Claudine
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Inst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Sorbonne Univ, Inst Nanosci Paris, UMR 7588, F-75005 Paris, FranceInst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Noguera, Claudine
Koltsov, Alexey
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ArcelorMittal Maizieres Res, F-57280 Voie Romaine, Maizieres Les M, FranceInst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France
Koltsov, Alexey
Mataigne, Jean-Michel
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ArcelorMittal Maizieres Res, F-57280 Voie Romaine, Maizieres Les M, FranceInst Nanosci Paris, CNRS, UMR 7588, F-75005 Paris, France