Three-dimensional shape measurement with binary dithered patterns

被引：169
|
作者：
Wang, Yajun [1 ]
Zhang, Song [1 ]
机构：
[1] Iowa State Univ, Dept Mech Engn, Ames, IA 50011 USA
来源：
APPLIED OPTICS | 2012年 / 51卷 / 27期
基金：
美国国家科学基金会;
关键词：
PULSE-WIDTH MODULATION;
D O I：
10.1364/AO.51.006631
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused. (C) 2012 Optical Society of America
引用
收藏
页码：6631 / 6636
页数：6
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