Test fixture for mapping thermal conduction in composites under transient and steady-state conditions

被引:1
|
作者
Carkhuff, BG
Roberts, JC
机构
[1] Applied Physics Laboratory, Johns Hopkins University, Laurel, MD
关键词
D O I
10.1111/j.1747-1567.1997.tb00516.x
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
A test fixture has been designed that allows the measurement of steady-state and transient temperature profiles in composites or other types of anisotropic or orthotropic materials under pure conduction in a vacuum. The uniqueness of this approach is the ability to study heat source to composite interface techniques by comparison of surface temperature contours and temperature versus time profiles. Localized changes in these conditions can be evaluated and the most successful technique can be adapted to larger parts, i.e., printed wiring boards (PWBs), electronic enclosure thermal walls, etc.
引用
收藏
页码:12 / 14
页数:3
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