Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations

被引：0
|
作者：
Sandru, Elena-Diana [1 ]
David, Emilian [2 ]
Pelz, Georg [2 ]
机构：
[1] Univ Politehn Bucuresti, Bucharest, Romania
[2] Infineon Technol, Bucharest, Romania
来源：
2020 27TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS) | 2020年
关键词：
Local Sensitivity Analysis; Process Control Monitor parameters; Corner Lots; Product Characterization;
D O I：
10.1109/icecs49266.2020.9294956
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a local sensitivity analysis methodology of circuit performances, i.e. Electrical Parameters (EPs), with manufacturing process variations, based on modelling the EPs dependence on the Process Control Monitor parameters. It can be used as an assisting tool for the designer, during the product characterization.
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页数：2
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