A study of microstructural imaging of Y2O3-doped Al2O3 with bimodal grain size distribution

被引：0

作者：

Fenk, B ^{[1
]}

Opielka, H ^{[1
]}

Kühnemann, S ^{[1
]}

Gülgün, MA ^{[1
]}

Bischoff, E ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70174 Stuttgart, Germany

来源：

PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY | 1999年 / 36卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

The morphology and grain growth of Y2O3-doped Al2O3-ceramics are investigated using atomic force microscopy, high resolution scanning electron microscopy, confocal laser microscopy and orientation imaging microscopy. With Y2O3-contents in excess of 500 ppm, bimodal grain size distribution and strong grain growth were observed. The methods of contrasting available using the various imaging techniques are explained and their possibilities and limits of use discussed.

引用

页码：433 / 445

页数：13

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