Test System for Digital General-purpose Integrated Chip

This paper introduces a test system for general-purpose Integrated Chip based on Microcontroller. The system receives keyboard information about the chip under test, then tests the function of the known chip; finally it determines whether the chip under test is faulty or not. It can also indentify the type of the unkown fault-free chip. By selecting the function switching key, the chip can be automatically tested. Experimental results are presented to demonstrate the effectness of the test system for digital general purpose integrated chip.