Couple stress-based flexoelectricity of frictionless contact in dielectrics
被引:7
|
作者:
Hadjesfandiari, Ali R.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Univ Bridgeport, Dept Mech Engneering, Bridgeport, CT 06604 USAUniv Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Hadjesfandiari, Ali R.
[1
,2
]
Hajesfandiari, Arezoo
论文数: 0引用数: 0
h-index: 0
机构:
NYU, Dept Mech & Aerosp Engn, New York, NY 11201 USAUniv Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Hajesfandiari, Arezoo
[3
]
Liu, Jun
论文数: 0引用数: 0
h-index: 0
机构:
Univ Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Univ Buffalo State Univ New York, RENEW Res & Educ Energy Environm & Water Inst, Buffalo, NY 14260 USAUniv Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Liu, Jun
[1
,4
]
Dargush, Gary F.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USAUniv Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
Dargush, Gary F.
[1
]
机构:
[1] Univ Buffalo State Univ New York, Dept Mech & Aerosp Engn, Buffalo, NY 14260 USA
[2] Univ Bridgeport, Dept Mech Engneering, Bridgeport, CT 06604 USA
[3] NYU, Dept Mech & Aerosp Engn, New York, NY 11201 USA
[4] Univ Buffalo State Univ New York, RENEW Res & Educ Energy Environm & Water Inst, Buffalo, NY 14260 USA
The presence of flexoelectricity in dielectric materials can affect the mechanics of contact between solid bodies, especially when viewed at the micro/nano-scale. Such an effect can also contribute significantly to contact electrification a charge transfer event that takes place at the contact interface. In particular, the state of deformation and stresses in the vicinity of the contacting area can differ markedly from that anticipated from classical elastic Hertzian contact theory. In the present work, we investigate the flexoelectric effect near the contacting area of an isotropic dielectric material pressed by a frictionless rigid insulator probe, serving as a model problem to reveal the potential role of flexoelectricity in contact mechanics and electrification. The investigation is based on consistent couple stress flexoelectric theory, in which electric polarization may appear due to two-way coupling between the electric field and mean curvature vectors, even for centrosymmetric dielectric materials. To this end, we develop a new boundary element formulation to calculate the displacement, stress, electric potential, and electric displacement for two-dimensional isotropic flexoelectric contact problems. The subsequent computational mechanics investigation highlights several important characteristics of triboelectric phenomena and shows that the state of stress and polarization in contacting isotropic dielectrics is dependent on the effective length scale parameter l of couple stress elasticity and the coupling flexoelectric coefficient f.
机构:
Southwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Northwestern Univ, Dept Mech Engn, Evanston, IL 60201 USASouthwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Wang, Yuxing
Zhang, Xin
论文数: 0引用数: 0
h-index: 0
机构:
Northwestern Univ, Dept Mech Engn, Evanston, IL 60201 USASouthwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Zhang, Xin
Shen, Huoming
论文数: 0引用数: 0
h-index: 0
机构:
Southwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R ChinaSouthwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Shen, Huoming
Liu, Juan
论文数: 0引用数: 0
h-index: 0
机构:
Southwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R ChinaSouthwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Liu, Juan
Zhang, Bo
论文数: 0引用数: 0
h-index: 0
机构:
Southwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
Hong Kong Polytech Univ, Dept Bldg & Real Estate, Hong Kong 999077, Peoples R ChinaSouthwest Jiaotong Univ, Sch Mech & Engn, Chengdu 610031, Peoples R China
机构:
Siemens Ind Software Ltd, Siemens PLM Software, Digital Factory Simulat & Test Solut, Cambridge CB2 1PH, EnglandSiemens Ind Software Ltd, Siemens PLM Software, Digital Factory Simulat & Test Solut, Cambridge CB2 1PH, England
Poya, Roman
Gil, Antonio J.
论文数: 0引用数: 0
h-index: 0
机构:
Swansea Univ, Coll Engn, Zienkiewicz Ctr Computat Engn, Bay Campus, Swansea SA1 8EN, W Glam, WalesSiemens Ind Software Ltd, Siemens PLM Software, Digital Factory Simulat & Test Solut, Cambridge CB2 1PH, England
Gil, Antonio J.
论文数: 引用数:
h-index:
机构:
Ortigosa, Rogelio
Palma, Roberto
论文数: 0引用数: 0
h-index: 0
机构:
Univ Jaume 1, Dept Mech Engn & Construct, Campus Riu Sec, Castellon de La Plana 12071, SpainSiemens Ind Software Ltd, Siemens PLM Software, Digital Factory Simulat & Test Solut, Cambridge CB2 1PH, England
机构:
Xi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R ChinaXi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R China
Qu, Y. L.
Zhang, G. Y.
论文数: 0引用数: 0
h-index: 0
机构:
Southeast Univ, Sch Civil Engn, Jiangsu Key Lab Engn Mech, Nanjing 210096, Jiangsu, Peoples R ChinaXi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R China
Zhang, G. Y.
Fan, Y. M.
论文数: 0引用数: 0
h-index: 0
机构:
Xi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R ChinaXi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R China
Fan, Y. M.
Jin, F.
论文数: 0引用数: 0
h-index: 0
机构:
Xi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R ChinaXi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian, Peoples R China
机构:
Univ Modena & Reggio Emilia, Dipartimento Sci & Metodi Ingn, I-42122 Reggio Emilia, Italy
Univ Modena & Reggio Emilia, Ctr Interdipartimentale En&tech, I-42122 Reggio Emilia, ItalyUniv Modena & Reggio Emilia, Dipartimento Sci & Metodi Ingn, I-42122 Reggio Emilia, Italy