Outage analysis of reconfigurable intelligent surface-assisted space shift keying

被引:0
|
作者
Jia, Xiaohui [1 ]
Yao, Fei [1 ]
Wang, Jiawei [1 ]
Deng, Keyan [1 ]
机构
[1] Northwest Minzu Univ, Coll Elect Engn, Baiyin Rd, Lanzhou 730000, Gansu, Peoples R China
关键词
Reconfigurable intelligent surface (RIS); Space shift keying (SSK); Outage probability (OP); Throughput; INDEX MODULATION;
D O I
10.1007/s11760-023-02594-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reconfigurable intelligent surface (RIS) and space shift keying (SSK) are critical enabling techniques for future wireless communications. In this paper, a RIS-assisted SSK system is proposed to efficiently improve the outage performance of the conventional SSK system. A detailed analysis is presented in order to evaluate the outage performance, and expressions for the outage probability (OP) and the throughput are derived for two different scenarios including the blind RIS-SSK and the intelligent RIS-SSK. Our results are verified through simulations, and insightful discussions are provided. Results show that the proposed RIS-assisted SSK scheme performance outperforms the conventional SSK scheme and achieves at least 20 dB SNR gain.
引用
收藏
页码:3677 / 3682
页数:6
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