High-Voltage (&gt;1.2 kV) AlGaN/GaN Monolithic Bidirectional HEMTs With Low On-Resistance (2.54 mΩ<middle dot>cm2)

被引:4
|
作者
Alam, Md Tahmidul [1 ]
Chen, Jiahao [1 ]
Bai, Ruixin [1 ]
Pasayat, Shubhra S. [1 ]
Gupta, Chirag [1 ]
机构
[1] Univ Wisconsin Madison, Dept Elect & Comp Engn, Madison, WI 53706 USA
关键词
Logic gates; MODFETs; HEMTs; Voltage measurement; Transistors; Wide band gap semiconductors; Threshold voltage; 2-D electron gas (2DEG); field plate; monolithic bidirectional GaN HEMT; TCAD; DC-DC CONVERTER; GAN HEMT; SWITCH;
D O I
10.1109/TED.2023.3330133
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-voltage (>1.2 kV) bidirectional AlGaN/GaN HEMTs were fabricated with low ON-resistance of similar to 10<middle dot>mm or specific ON-resistance of 2.54 m Omega<middle dot>cm(2). Two field plates with variable lengths were utilized on each side to experimentally optimize the breakdown voltage and notice the trend of breakdown voltage variation with field plate dimensions. It was observed that the total length of the field plates should be kept smaller than a "critical value" to achieve high blocking voltage. The underlying physics of this behavior was explained and justified with TCAD simulations. The highest breakdown voltage in our fabricated devices was 1360 V. A qualitative design guide was proposed for maximizing the breakdown voltage inmonolithic bidirectional HEMTs with multiple field plates
引用
收藏
页码:733 / 738
页数:6
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