A Simple and Economical System for Automatic Near-Field Scanning for Power Electronics Converters

被引:0
|
作者
Grasso, Sebastiano [1 ]
Bellinvia, Salvatore [1 ]
Salerno, Nunzio [2 ]
Rizzo, Santi Agatino [2 ]
机构
[1] STMicroelect, Stradale Primosole 50, I-95121 Catania, Italy
[2] Univ Catania, Dept Elect Elect & Comp Engn DIEEI, I-95125 Catania, Italy
关键词
electromagnetic compatibility; near-field scan; power electronics; EMI;
D O I
10.3390/en16237868
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Electromagnetic compatibility issues must be considered from the early steps in the design of electronic devices. A specific topic is the near-field emission generated by the device due to the traces on a printed circuit board and the specific routing. The analysis of near-field emission is essential to detect potential electromagnetic interference with nearby devices. This problem is crucial in high power density applications. Therefore, especially in these applications, it is necessary to optimize the circuit and the layout to minimize the generated noise. The design and construction of systems able to scan volumes to determine the spatial distribution of electrical E and/or magnetic B fields in the near-field region of a device under test is a very complex process. The realization of equipment that explores a given surface at a given distance from the device is easier. The main purpose of this paper is to show how it is possible to build a cheap two-dimensional scanner, starting from simple hardware not explicitly designed for near-field scan operations. The presented firmware and software solution can map, with good accuracy, the spatial distribution of fields B and E on a fixed plan close to the board. Finally, the developed system has been used in a GaN-based bi-directional DC/DC Converter.
引用
收藏
页数:17
相关论文
共 50 条
  • [1] An Automatic Tuning System to Improve Near-Field Powering in Implanted Electronics
    Collu, Riccardo
    Salis, Cinzia
    Barbaro, Massimo
    PRIME 2022: 17TH INTERNATIONAL CONFERENCE ON PHD RESEARCH IN MICROELECTRONICS AND ELECTRONICS, 2022, : 277 - 280
  • [2] A simple scanning head for scanning near-field optical microscope
    Kazantsev, DV
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 191 - 198
  • [3] Simple Method for Calculating the Sensitivity of Near-field Scanning System Based on Transfer Function
    He, Xin
    Li, Xiao-Chun
    Liu, Yu-Xu
    Mao, Jun-Fa
    2022 PHOTONICS & ELECTROMAGNETICS RESEARCH SYMPOSIUM (PIERS 2022), 2022, : 107 - 112
  • [4] Near-field characterisation of power electronics circuits for radiation prediction
    Youssef, M
    Roudet, J
    Marechal, Y
    PESC'97: 28TH ANNUAL IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE - RECORD, VOLS I AND II, 1997, : 1529 - 1534
  • [5] Scanning laser terahertz near-field imaging system
    Serita, Kazunori
    Mizuno, Shori
    Murakami, Hironaru
    Kawayama, Iwao
    Takahashi, Yoshinori
    Yoshimura, Masashi
    Mori, Yusuke
    Darmo, Juraj
    Tonouchi, Masayoshi
    OPTICS EXPRESS, 2012, 20 (12): : 12959 - 12965
  • [6] An experimental system for scanning near-field optical microscopy
    Williamson, R.
    1997, (27):
  • [7] PLANAR REACTIVE NEAR-FIELD SCANNING SYSTEM AT KRISS
    Lee, Dong-Joon
    Kang, No-Weon
    Kwon, Jae-Yong
    Lee, Joo-Gwang
    Kang, Jin-Seob
    2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, 2010, : 361 - 362
  • [8] A THz Near-Field Scanning System for Antenna Measurement
    Wong, C. K.
    Ng, K. B.
    Yi, H.
    Qu, S. -W.
    Chan, C. H.
    2017 IEEE SIXTH ASIA-PACIFIC CONFERENCE ON ANTENNAS AND PROPAGATION (APCAP), 2017,
  • [9] Three Dimensional Scanning System for Near-field Measurements
    Sivaraman, Nimisha
    Jomaa, Kassem
    Ndagijimana, Fabien
    2017 11TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION (EUCAP), 2017,
  • [10] Near-field scanning tomography
    Gaikovich, Konstantin P.
    ICTON 2006: 8TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 1, PROCEEDINGS: ICTON, MPM, INDUSTRIAL, PICAW, GOWN, 2006, : 250 - 255