1,4-Bis(trimethylsilyl)piperazine-Thermal Properties and Application as CVD Precursor

被引:3
|
作者
Ermakova, Evgeniya [1 ]
Sysoev, Sergey [2 ]
Tsyrendorzhieva, Irina [3 ]
Mareev, Alexander [3 ]
Maslova, Olga [1 ]
Shayapov, Vladimir [1 ]
Maksimovskiy, Eugene [1 ]
Yushina, Irina [1 ]
Kosinova, Marina [1 ]
机构
[1] SB RAS, Nikolaev Inst Inorgan Chem, Lab Funct Films & Coatings, Novosibirsk 630090, Russia
[2] SB RAS, Nikolaev Inst Inorgan Chem, Lab Thermodynam Inorgan Mat, Novosibirsk 630090, Russia
[3] SB RAS, AE Favorsky Irkutsk Inst Chem, Lab Med & Pharmaceut Chem, Irkutsk 664033, Russia
基金
俄罗斯科学基金会;
关键词
silicon carbonitride (SiCN) coatings; organosilicon precursor; vapor pressure; tensimetry; PECVD; thin film; single-source precursor; refractive index; optical bandgap; CHEMICAL-VAPOR-DEPOSITION; SILICON CARBONITRIDE FILMS; THIN-FILMS; OPTICAL-PROPERTIES; ATMOSPHERIC-PRESSURE; PLASMA CVD; MECHANICAL-PROPERTIES; ELECTRONIC-STRUCTURE; COUPLED PLASMAS; SICXNY FILMS;
D O I
10.3390/coatings13061045
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report an investigation into 1,4-Bis-N,N-(trimethylsilyl)piperazine (BTMSP) as a novel precursor for the synthesis of silicon carbonitride films by chemical vapor deposition (CVD). The thermal stability, temperature dependence of vapor pressure and thermodynamic constants of the evaporation process of BTMSP were determined by static tensimetry with a glass membrane zero manometer. The transformation of the compound in low-power (25 W) plasma conditions was investigated by optical emission spectroscopy. It was shown that BTMSP undergoes destruction, accompanied by H and CH elimination and CN formation. SiCN(H) films were deposited in a hot-wall plasma-enhanced CVD reactor. The optical properties of the films were studied by spectral ellipsometry (refractive index: 1.5-2.2; absorption coefficient: 0-0.12) and UV-Vis spectroscopy (transmittance: up to 95%; optical bandgap: 1.6-4.9 eV). Information on the aging behavior of the films is also provided. The transformation of the films occurred through water adsorption and the formation of Si-O bonds with the degradation of Si-H, N-H and Si-CHx-Si bonds.
引用
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页数:23
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