Publisher's Note: "Emerging multi-frequency surface strain force microscopy" [J. Appl. Phys. 133, 040901 (2023)]

被引：0

作者：

Zeng, Qibin ^{[1
,2
]}

Sim, Celine ^{[2
]}

Yong, Anna Marie ^{[2
]}

Hui, Hui Kim ^{[2
]}

Chen, Yunjie ^{[2
]}

Zhang, Lei ^{[2
]}

Tan, Chee Kiang Ivan ^{[2
]}

Liu, Huajun ^{[2
]}

Zeng, Kaiyang ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore

[2] Inst Mat Res & Engn, ASTAR Agcy Sci Res & Technol, Singapore 138634, Singapore

来源：

JOURNAL OF APPLIED PHYSICS | 2023年 / 133卷 / 08期

关键词：

D O I：

10.1063/5.0145762

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页数：1

共 32 条

[1] Erratum: Emerging multi-frequency surface strain force microscopy (Journal of Applied Physics (2023) 133 (040901) DOI: 10.1063/5.0131075)
Department of Mechanical Engineering, National University of Singapore, Singapore
117576, Singapore
不详
138634, Singapore
J Appl Phys, 1600, 8
[2] Comment on "Thermal frequency noise in dynamic scanning force microscopy" [J. Appl. Phys. 109, 024310 (2011)]
Gauthier, Sebastien
JOURNAL OF APPLIED PHYSICS, 2011, 110 (03)
[3] Publisher's note: "Efficient micromagnetic-elastic simulations based on a perturbed Lagrangian function" [J. Appl. Phys. 134, 103901 (2023)]
Reichel, Maximilian
Niekamp, Rainer
Schroeder, Joerg
JOURNAL OF APPLIED PHYSICS, 2023, 134 (16)
[4] Publisher's Note: "Synchronous electro-optical method for studying mixed ionic-electronic conductors with hopping transport" [J. Appl. Phys. 133, 024901 (2023)]
Kalaev, Dmitri
JOURNAL OF APPLIED PHYSICS, 2023, 133 (04)
[5] Erratum: Low frequency photothermal excitation of AFM microcantilevers (J. Appl. Phys. (2023) 133 (214502) DOI: 10.1063/5.0147341)
Journal of Applied Physics, 2023, 134 (06):
[6] Response to the "Comment on 'Thermal frequency noise in dynamic scanning force microscopy'" [J. Appl. Phys. 110, 036107 (2011)]
Colchero, J.
Gonzalez Martinez, Juan Francisco
Abad, Jose
Perez Garcia, B.
Cuenca, M.
Palacios-Lidon, E.
Abellan, J.
JOURNAL OF APPLIED PHYSICS, 2011, 110 (03)
[7] Emerging multi-frequency surface strain force microscopy
Zeng, Qibin
Sim, Celine
Yong, Anna Marie
Hui, Hui Kim
Chen, Yunjie
Zhang, Lei
Tan, Chee Kiang Ivan
Liu, Huajun
Zeng, Kaiyang
JOURNAL OF APPLIED PHYSICS, 2023, 133 (04)
[8] Erratum: Secondary electron emission and vacuum electronics (J. Appl. Phys. (2023) 133 (050901) DOI: 10.1063/5.0130972)
Yater, J.E.
Journal of Applied Physics, 2023, 133 (09):
[9] Publisher's Note: "High-volume biological sample processing using microwaves" [J. Appl. Phys. 135, 044901 (2024)]
Wilson-Garner, S.
Alzeer, S.
Baillie, L.
Porch, A.
JOURNAL OF APPLIED PHYSICS, 2024, 135 (11)
[10] Erratum: 'a quantitative analysis of surface deformation by stick/slip atomic force microscopy' [J. Appl. Phys. 82, 3763 (1997)]
J Appl Phys, 6 (3444):

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