Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

被引：0

作者：

Carnesecchi, E. ^{[1
]}

Sabiu, B. ^{[2
,3
]}

Strazzi, S. ^{[2
,3
]}

Vignola, G. ^{[3
]}

Agrawal, N. ^{[2
,3
]}

Alici, A. ^{[2
,3
]}

Antonioli, P. ^{[3
]}

Arcelli, S. ^{[2
,3
]}

Bellini, E. ^{[2
,3
]}

Cavazza, D. ^{[3
]}

Cifarelli, L. ^{[2
,3
]}

Colocci, M. ^{[2
,3
]}

Durando, S. ^{[4
]}

Ercolessi, F. ^{[2
,3
]}

Falchieri, D. ^{[3
]}

Ficorella, A. ^{[5
]}

Fraticelli, C. ^{[2
,3
]}

Garbini, M. ^{[3
,6
,7
]}

Giacalone, M. ^{[2
,3
]}

Gola, A. ^{[5
]}

Hatzifotiadou, D. ^{[3
]}

Jacazio, N. ^{[2
,3
]}

Margotti, A. ^{[3
]}

Malfattore, G. ^{[2
,3
]}

Nania, R. ^{[3
]}

Noferini, F. ^{[3
]}

Paternoster, G. ^{[5
]}

Pinazza, O. ^{[3
]}

Preghenella, R. ^{[3
]}

Rath, R. ^{[3
]}

Ricci, R. ^{[8
]}

Rignanese, L. ^{[3
]}

Romanenko, G. ^{[2
,3
]}

Rubini, N. ^{[2
,3
]}

Scapparone, E. ^{[3
]}

Scioli, G. ^{[2
,3
]}

Zichichi, A. ^{[2
,3
]}

机构：

[1] CERN, Esplanade Des Particules 1 Geneva, CH-1211 Geneva 23, Switzerland

[2] Univ Bologna, Dipartimento Fis & Astron A Righi, Viale Carlo Berti Pichat 6-2, I-40127 Bologna, Italy

[3] Ist Nazl Fis Nucl, Sez Bologna, Viale Carlo Berti Pichat 6-2, I-40127 Bologna, Italy

[4] Politecn Torino, Dipartimento Elettron & Telecomunicaz, Corso Duca Abruzzi 24, I-10129 Turin, Italy

[5] Fdn Bruno Kessler, Via Sommarive 18, I-38123 Povo, Italy

[6] Museo Stor Fis, Via Panisperna 89 A, I-10129 Rome, Italy

[7] Ctr Studi Enrico Fermi, Via Panisperna 89 A, I-10129 Rome, Italy

[8] Univ Salerno, Dipartmento Fis, Via Giovanni Paolo II 132, I-84084 Salerno, Italy

来源：

EUROPEAN PHYSICAL JOURNAL PLUS | 2023年 / 138卷 / 09期

关键词：

D O I：

10.1140/epjp/s13360-023-04397-0

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.

引用

页数：7

共 50 条

[1] Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
F. Carnesecchi
B. Sabiu
S. Strazzi
G. Vignola
N. Agrawal
A. Alici
P. Antonioli
S. Arcelli
F. Bellini
D. Cavazza
L. Cifarelli
M. Colocci
S. Durando
F. Ercolessi
D. Falchieri
A. Ficorella
C. Fraticelli
M. Garbini
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G. Malfattore
R. Nania
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O. Pinazza
R. Preghenella
R. Rath
R. Ricci
L. Rignanese
G. Romanenko
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E. Scapparone
G. Scioli
A. Zichichi
The European Physical Journal Plus, 138
[2] Direct detection of charged particles with SiPMs
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