Fast short-circuit protection under current imbalance condition for multi-paralleled SiC-MOSFETs

被引:1
|
作者
Suzuki, Hiroshi [1 ]
Funaki, Tsuyoshi [2 ]
机构
[1] Hitachi Ltd, Res & Dev Grp, Hitachi, Ibaraki 3191292, Japan
[2] Osaka Univ, Grad Sch Engn, Elect & Infocommunicat Engn, Suita, Osaka, Japan
关键词
current imbalance; fast current detection; multi-parallel dies; short-circuit; SiC-MOSFET; OVERCURRENT PROTECTION; BEHAVIOR;
D O I
10.1002/eej.23429
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes methodology and gate drive circuit that can immediately detect short-circuit (SC) of multiparalleled SiC-MOSFETs even under current imbalance condition. Proposed method detects SC current using an integration circuit that can sense di/dt. The detection level of SC current can be adjusted to a desired value regardless of the number of SiC-MOSFETs connected in parallel. The effectiveness of the proposed approach was experimentally validated for four-paralleled SiC-MOSFETs under extreme current imbalance in SC condition. SC was detected within 0.5 mu s and all SiC-MOSFETs were protected without destruction at most 2.2 mu s after the onset of SC, for all types of SC 1, 2, and 3.
引用
收藏
页数:12
相关论文
共 50 条
  • [1] Fast Short-circuit Protection under Current Imbalance Condition for Multi-Paralleled SiC-MOSFETs
    Suzuki, Hiroshi
    Funaki, Tsuyoshi
    IEEJ Transactions on Industry Applications, 2023, 143 (01): : 35 - 45
  • [2] Particularities of the Short-Circuit Operation and Failure Modes of SiC-MOSFETs
    Unger, Christian
    Pfost, Martin
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2021, 9 (05) : 6432 - 6440
  • [3] Review on Short-Circuit Protection Methods for SiC MOSFETs
    Lyu, Gang
    Ali, Hamid
    Tan, Hongrui
    Peng, Lyuzhang
    Ding, Xiaofeng
    ENERGIES, 2024, 17 (17)
  • [4] Review of Short-circuit Protection Circuits for SiC MOSFETs
    Lee, Seungjik
    Lee, Ockgoo
    Nam, Ilku
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023, 23 (02) : 128 - 137
  • [5] Effect of Parasitic Inductance Mismatch on Short-Circuit Characterization of Paralleled SiC MOSFETs
    Zou, Qi
    Ke, Junji
    Peng, Jiaoyang
    Zhao, Zhibin
    2019 4TH IEEE WORKSHOP ON THE ELECTRONIC GRID (EGRID), 2019, : 536 - 543
  • [6] Ultra-Fast Short-Circuit Detection for SiC-MOSFETs Using DC-Link Voltage Monitoring
    Laumen, Michael
    Luedecke, Christoph
    De Doncker, Rik W.
    2020 IEEE 11TH INTERNATIONAL SYMPOSIUM ON POWER ELECTRONICS FOR DISTRIBUTED GENERATION SYSTEMS (PEDG), 2020, : 547 - 553
  • [7] A Fast Short-Circuit Protection Method Using Gate Charge Characteristics of SiC MOSFETs
    Horiguchi, Takeshi
    Kinouchi, Shin-ichi
    Nakayama, Yasushi
    Akagi, Hirofumi
    2015 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2015, : 4759 - 4764
  • [8] Analysis of Short-Circuit Break-Down Point in 3.3 kV SiC-MOSFETs
    Tani, Kazuki
    Sakano, Jun-ichi
    Shima, Akio
    PRODCEEDINGS OF THE 2018 IEEE 30TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2018, : 383 - 386
  • [9] Short-Circuit Evaluation and Overcurrent Protection for SiC Power MOSFETs
    Awwad, Abdullah Eial
    Dieckerhoff, Sibylle
    2015 17TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'15 ECCE-EUROPE), 2015,
  • [10] Short-Circuit Fault Adaptive Analysis and Protection for SiC MOSFETs
    Wang, Qiang
    Zhang, Jingwei
    Iannuzzo, Francesco
    Jiang, Yizhan
    Zhang, Weifeng
    He, Fengyou
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2023, 11 (05) : 4867 - 4881