Statistical nature of secondary electron emission

The energy-dependence of the secondary electron yield by electron impact on clean materials is shown, through comparisons with both experimental data and previous semi-empirical models, to be described well by a log-normal distribution. The maximum yield and corresponding energy are calculated in terms of the fit parameters. The function also agrees with the 'universal curve' obtained by expressing the experimental data in terms of the position and magnitude of maximum yield. The positron-and ion-induced secondary electron yields also exhibit a log-normal dependence and this is used to extend their energy ranges without prior knowledge of the position and magnitude of their maxima. In addition to their intrinsic usefulness, the results provide further support for the statistical description of inelastic processes advanced by Laricchia et al. (2018).