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- [2] Effects of surface roughness and copper contamination on the oxide breakdown of silicon wafer Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (6 A): : 3662 - 3668
- [3] Effects of surface roughness and copper contamination on the oxide breakdown of silicon wafer JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (6A): : 3662 - 3668
- [8] Effects of moisture and temperature ageing on reliability of interfacial adhesion with black copper oxide surface POLYTRONIC 2002: 2ND INTERNATIONAL IEEE CONFERENCE ON POLYMERS AND ADHESIVES IN MICROELECTRONICS AND PHOTONICS, CONFERENCE PROCEEDINGS, 2002, : 54 - 62