Acceptance sampling plan using new truncated Weibull-X family based on run lengths of conforming items

In this paper, we develop two acceptance sampling plans where the lifetimes of the products follow Weibull Exponential and Weibull Lomax distributions both of which are derived from the new truncated Weibull-X family of distributions based on run lengths of the conforming items. The model parameters are estimated using the maximum likelihood method contrary to the existing plans where authors selected arbitrary values of the parameters. The efficiency of the proposed plan is established by comparing it with the existing plan based on the average number of inspected items. A real example of failure rates of a piece of electronic equipment operating in a specific mode is presented to illustrate the proposed plans for industrial use.