Pulsed thermography;
support vector regression;
material inspection;
defect detection;
IRNDT;
active thermography;
PRINCIPAL COMPONENT THERMOGRAPHY;
ENHANCEMENT;
D O I:
10.1080/17686733.2021.2025015
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
This study introduces and evaluates a new approach to reconstruct image sequences acquired during non-destructive testing by pulsed thermography. The proposed method consists of applying two linear support vector regressions to model the evolution of the data from both a spatial and temporal point of view. Each regression vectors will map the data with the number of pixels and the number of frames using convex optimisation. Then the regression vectors are used to predict a more robust representation of the data, thus reconstructing the sequence. The proposed method has been applied to data related to a reference sample of carbon reinforced fibre with known defects. This approach was evaluated on a sequence with severe non-uniform heating and was compared with state-of-the-art methods. Despite being sensitive to non-uniform heating, the proposed method provided a higher CNR score on smaller defects, compared with state-of-the-art methods. For the shallowest defects it shows better performance in term of contrast reconstruction compared to partial least-squares thermography (PLST). It also outperforms principal component thermography (PCT), and thermographic signal reconstruction-PCT (TSR-PCT) for defects located at a depth of 0.6 mm and 0.8 mm below the surface.
机构:
Univ Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, CanadaUniv Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, Canada
Fleuret, Julien
Genest, Marc
论文数: 0引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Aerospace Portfolio Struct Mat & Mfg, 1200 Montreal Rd, Ottawa, ON K1A 0R6, CanadaUniv Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, Canada
Genest, Marc
论文数: 引用数:
h-index:
机构:
Ibarra-Castanedo, Clemente
论文数: 引用数:
h-index:
机构:
Robitaille, Francois
Joncas, Simon
论文数: 0引用数: 0
h-index: 0
机构:
Ecole Technol Super, Dept Automated Mfg Engn, 1100 Rue Notre Dame Ouest, Montreal, PQ H3C 1K3, CanadaUniv Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, Canada
Joncas, Simon
Maldague, Xavier
论文数: 0引用数: 0
h-index: 0
机构:
Univ Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, CanadaUniv Laval, Dept Elect & Comp Engn, Comp Vis & Syst Lab, 1065 Av Med, Quebec City, PQ G1V 0A6, Canada
机构:
Chinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Chinese Acad Sci, Key Lab Networked Control Syst, Shenyang 110016, Peoples R China
Chinese Acad Sci, Inst Robot & Intelligent Mfg, Shenyang 110169, Peoples R ChinaChinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Zhang, Yinlong
Yuan, Libiao
论文数: 0引用数: 0
h-index: 0
机构:
Guangdong Telecommun Terminal Prod Qual Supervis &, Heyuan 517001, Peoples R ChinaChinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Yuan, Libiao
Zeng, Ziming
论文数: 0引用数: 0
h-index: 0
机构:
Shenzhen Polytech Univ, Sch Automot & Transportat Engn, Shenzhen 518055, Peoples R ChinaChinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Zeng, Ziming
Liang, Wei
论文数: 0引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Chinese Acad Sci, Key Lab Networked Control Syst, Shenyang 110016, Peoples R China
Chinese Acad Sci, Inst Robot & Intelligent Mfg, Shenyang 110169, Peoples R ChinaChinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Liang, Wei
Pang, Zhibo
论文数: 0引用数: 0
h-index: 0
机构:
ABB Corp Res, S-72178 Vasteras, Sweden
Royal Inst Technol, Dept Intelligent Syst, S-11428 Stockholm, SwedenChinese Acad Sci, Shenyang Inst Automat, State Key Lab Robot, Shenyang 110016, Peoples R China
Pang, Zhibo
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN INDUSTRIAL ELECTRONICS,
2024,
5
(03):
: 1234
-
1247